Total-reflection X-ray fluorescence, or TXRF, and its related methods have been used increasingly for multi element analysis in laboratories and industry worldwide. Providing reliable, economical readings of the minute mass or extremely low concentration of elements, TXRF is especially suitable for ultramicro- and trace analysis. It is also effective in the analysis of flat sample surfaces and stratified near-surface layers, offering a nondestructive means of quality control of wafers for the semiconductor industry by a fast mapping of possible unwanted contaminations.
The new edition is completely updated and nearly doubled. Particular emphasis has been placed on new methods and techniques including: Silicon-drift detector with Peltier-cooling, powerful and particular excitation by synchrotron radiation, simple wavelength-dispersive X-ray spectrometer especially for light element detection and speciation, TXRF after chemical and physical etching of thin layers to give information on the nanometer-scale, GI-XRF for non-destructive depth profiling of thin flat coverings and implantations, TXRF combined with EXAFS, XANES, XRD, and XPS to gain insight into the molecular and even into the electronic structure of atoms.
Total-Reflection X-Ray Fluorescence Analysis helps professionals evaluate the suitability of this method to their specific needs, pinpoint new applications, and gain insight into the future of TXRF. It is an excellent text for graduate students and a useful guide for scientists and technicians in a wide range of fields.
Total-Reflection X-ray Fluorescence Analysis and Related Methods, Second Edition features:
- The uses of TXRF in ultramicro- and trace analysis, and in surface- and near-surface-layer analysis
- Instrumentation and setups, particularly high-power X-ray sources, beam-adapting units, sample positioning, and energy-dispersive detection and registration
- Explores new applications of TRXF since the publication of the first edition
- Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation
- Includes about 700 references for further study
Written by leading experts in X-ray spectral analysis, the second edition provides an overview of the field, reveals the advantages of TXRF over competing methods, and describes its application in numerous fields, including biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry.
