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Conductive Atomic Force Microscope
Lanza
ISBN: 978-3-527-34091-0
Hardcover
270 pages
November 2017
This is an out of stock title.
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  • Table of Contents
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This book is the first one to provide reference manual for researchers using CAFM in studying nanomaterials, which concentrates in the study of electronic properties of nanosctructured materials and devices at the nanoscale. It encompasses the description of novel strategies, configurations and setups based on CAFM that allow perform enhanced measurements.
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