سبد خرید  cart.gif |  حساب من |  تماس با ما |  راهنما     Search
موضوعات مرتبط
Cover image for product 3527340912
Conductive Atomic Force Microscope
Lanza
ISBN: 978-3-527-34091-0
Hardcover
270 pages
November 2017
This is an out of stock title.
  • Description
  • Table of Contents
  • Author Information
This book is the first one to provide reference manual for researchers using CAFM in studying nanomaterials, which concentrates in the study of electronic properties of nanosctructured materials and devices at the nanoscale. It encompasses the description of novel strategies, configurations and setups based on CAFM that allow perform enhanced measurements.
Wiley PLUS
Confidence. Motivation. Success.