This timely book delves into the rapidly developing, and cutting-edge field, of low-voltage electron microscopy that has only recently become available due to the rapid developments in the electron optics design and image processing. Low-voltage techniques are particularly crucial in nanotechnology and the study of surface related phenomena, allowing researchers to observe materials as never before.
Contributions in this book provide an overview of the different low-voltage microscope techniques for research, essentially providing a handbook for scientists working in this field.
This topical book highlights the relevant applications of low-voltage microscopy to materials science, nanotechnology and biological research, covering topics such as imaging techniques and elemental microanalysis, and addressing the issues associated with sample preparation requirements for low-voltage imaging and analysis. It will serve as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology. Edited by two eminently qualified scientists, with contributions from leading researchers, this is the first book in the field to give a description of low voltage electron microscopy as a whole.
Low Voltage Electron Microscopy: Principles and Applications focuses on the recent advances in this field, covering topics in TEM, SEM, and STEM, including:
- New developments in microscope design and improvement in operation.
- Developments and improvements to existing detector technologies.
- Novel applications of low voltage for imaging and microanalysis of nanomaterials, biological specimens as well as beam sensitive materials.
- A discussion dedicated to the unique electron optics designs for SEM and TEM and comparison to the emerging field of He ion microscopy.
