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Cover image for product 0471584894
Christou
ISBN: 978-0-471-58489-6
Hardcover
343 pages
February 1994, ©1993
This is an out of stock title.
  • Description
  • Table of Contents
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
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